Overview

What’s the current situation?

In the coming years European Semiconductor companies will bring many new applications to the market to improve the way of living in Europe. Examples are linked to road safety, personal health care, secured wireless communications, and lighting and consumer electronics. These applications concern very complex semiconductor systems with highly integrated technologies where digital, memories and analogue are funnelled in one piece of silicon.

Where is the problem?

In these kind of applications, reliability and trustability is a key factor which cannot be guaranteed without extensive test solutions. This may lead to expensive and unreliable test solutions when necessary preventive efforts are omitted.

What we are doing about it?

HADES project aims at providing a hierarchy-aware smart and secure embedded test infrastructure for dependability and performance enhancement of integrated systems.
In order to achieve this ambition goal, HADES will move forward from the classic design and post-silicon fabrication test approach to a new, efficient, scalable and low-cost on-line paradigm.
The project purpose is to address the following markets : i) machine to machine and connected systems, ii) remote-controlled systems, iii) smart home and mobile phone, iv) safety-critical systems – typically found in the automotive and avionics domains, v) mission-critical systems -such as in space and security applications.
HADES outcomes will allow creating added value at system and user levels thanks to the secure test infrastructure (ETIs and associated tools) used for hierarchical on-line tests defined in the corresponding field of the application. HADES project plans to support a large number of industrial applications by using the following standards: IEEE JTAG1687 for large digital SoCs and SPI or I2C for smaller digital SoCs or for RF/Analog blocks in mixed-signal SoCs.
HADES will offer to Electronics Components & Subsystems and IoT systems, at the project end, the following test techniques: i) test capabilities and reusability throughout the product life cycle, ii) test bus access with the required security level, iii) test costs compatible with IoT low cost devices and high volume, iv) on-line monitoring for enhanced dependability, prognostics, and diagnosis, v) on-line monitoring for system-level power management.
By offering more robustness and dependability to systems’ makers, the project will provide a key competitive advantage to the European industry. As the Hades god (who was wearing a cap of invisibility when going in the upper world), the hierarchical embedded test infrastructure, developed based on the HADES framework, will be transparent to the system under monitoring.

The HADES project has roots in the precursor project ELESIS