Dissemination

Peer-reviewed papers in international conferences:

  • Vayssade, F. Azais, L. Latorre and F. Lefevre, “Low-cost functional test of a 2.4GHz OQPSK transmitter using standard digital ATE,” IEEE International Symposium on On-Line Testing and Robust System Design (IOLTS), Platja d’Aro, Spain, 2018
  • H.-G. Stratigopoulos, “Machine learning applications in IC testing,” IEEE European Test Symposium (ETS), Bremen, Germany, May 2018
  • S. Feitoza, M. J. Barragan, S. Mir and D. Dzahini, “Reduced-code static linearity test of SAR ADCs using a built-in incremental Σ∆ converter.” IEEE Int. Symp. on On-Line Testing and Robust System Design (IOLTS). July 2018
  • Sivadasan, R. Jitendrakumar Shah, V. Huard, F. Cacho, L. Anghel, “NBTI aged cell rejuvenation with back biasing and resulting critical path reordering for digital circuits in 28nm FDSOI”, Design, Automation & Test in Europe Conference & Exhibition (DATE), 2018.
  • “R. Shah, F. Cacho, V. Huard, S. Mhira, D. Arora, P. Agarwal, S. Kumar, S. Balaraman, B. Singh, L. Anghel. “Investigation of speed sensors accuracy for process and aging compensation”,IEEE International Reliability Physics Symposium (IRPS), 2018.”
  • Ali, H. Ebrahimi, J. Pathrose and H. G. Kerkhoff, “Design and implementation of a dependable CPSoC for automotive applications,” IEEE Industrial Cyber-Physical Systems (ICPS), St. Petersburg, Russia, 2018, pp. 246-251
  • Ali, J. Pathrose and H. G. Kerkhoff, “On-Chip Lifetime Prediction for Dependable Many-Processor SoCs based on Data Fusion,” IEEE International Symposium on Embedded Multicore/Many-core Systems-on-Chip (MCSoC), Hanoi, Vietnam, 2018

Workshop papers:

  • Ibrahim, H. G. Kerkhoff, “ In-Field Utilization of the IEEE 1687 Standard,” International Test Standards Application Workshop (TESTA), Bremen, Germany, 2018

National conferences:

  • Reynaud, P. Maistri, R. Leveugle, «Accès autorisé au réseau reconfigurable de test par ensemble de segments», 13ème Colloque du GDR SoC/SiP, Paris, June 2018

Peer-reviewed journal paper submissions:

  • S. Feitoza, M. J. Barragan, S. Mir and D. Dzahini, “Reduced-code static linearity test of split-capacitor SAR ADCs using an embedded incremental Σ∆ converter” IEEE Transactions on Device and Materials Reliability, 2018 (submitted)
  • Vayssade, F. Azais, L. Latorre and F. Lefevre, “Low-cost Digital Test Solution for Symbol Error Detection of RF ZigBee Transmitters,” IEEE Transactions on Device and Material Reliability, 2018 (submitted)

Invited Talks:

  • G. Kerkhoff, “How to Guarantee High Dependability of Future Many-Core Systems-on-Chip,” IEEE International Symposium on Embedded Multicore/Many-core Systems-on-Chip (MCSoC), Keynote, Hanoi, Vietnam, 2018
  • H.-G. Stratigopoulos, “Adaptive Test: Machine Learning in Real Time on Big Data,” IEEE VLSI Test Symposium (VTS), Invited Talk in Special Session, San Francisco, CA, USA, April 2018
  • Nofal, “Evaluation Tool of MCUs Distributions in Memories”, Invited Talk in Special Session, IOLTS 2018

Tutorials at conferences:

  • H.-G. Stratigopoulos and Y. Makris, “From Data to Actions: Applications of Data Analytics in Semiconductor Manufacturing & Test,” IEEE International Test Conference (ITC), Half-day Tutorial, Fort Worth, TX, USA, October 2017
  • H.-G. Stratigopoulos, “Machine learning applications in IC testing,” IEEE European Test Symposium (ETS), Embedded Tutorial, Bremen, Germany, May 2018

M.Sc. Thesis:

  • Geerlings, “Analysis and Design of a Dependability Manager for Self-Aware System-on-Chips,” Master’s thesis, University of Twente, 2018